Add testing for i32 array to test array logic

This commit is contained in:
2025-04-21 17:47:33 +01:00
parent a359331df7
commit d3f1686d58
4 changed files with 157 additions and 0 deletions

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#ifndef TEST_INT_ARRAY_H
#define TEST_INT_ARRAY_H
#include "wapp.h"
#ifdef WAPP_PLATFORM_CPP
BEGIN_C_LINKAGE
#endif // WAPP_PLATFORM_CPP
TestFuncResult test_i32_array(void);
TestFuncResult test_i32_array_with_capacity(void);
TestFuncResult test_i32_array_get(void);
TestFuncResult test_i32_array_set(void);
TestFuncResult test_i32_array_append_capped(void);
TestFuncResult test_i32_array_extend_capped(void);
TestFuncResult test_i32_array_clear(void);
TestFuncResult test_i32_array_pop(void);
#ifdef WAPP_PLATFORM_CPP
END_C_LINKAGE
#endif // WAPP_PLATFORM_CPP
#endif // !TEST_INT_ARRAY_H